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Electron and ion microscopy and microanalysis : principles and applications / Lawrence E. Murr.
Author:
Murr, Lawrence Eugene.
Imprint:
New York : Marcel Dekker, c1982.
Description
xiv, 793 p. : ill. ; 27 cm.
Bibliography Note:
Includes bibliographical references and indexes.
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Author:
Murr, Lawrence Eugene.
Series Statement
Optical engineering ; v. 1
Subject:
Electron microscopy.
Field ion microscopy.
Microprobe analysis.
Series Added Entry-Uniform title
Optical engineering (Marcel Dekker, Inc.) ; v. 1.
