Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.

Author: Goodhew, Peter J.

Edition Statement:3rd ed.

Imprint:London ; New York : Taylor & Francis, 2001.

Descriptionx, 251 p. : ill. ; 24 cm.

Bibliography Note:Includes bibliographical references (p. [236]-237) and index.

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