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Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
Author:
Reimer, Ludwig, 1928-
Edition Statement:
2nd completely rev. and updated ed.
Imprint:
Berlin ; New York : Springer, c1998.
Description
xiv, 527 p. : ill. ; 24 cm.
Bibliography Note:
Includes bibliographical references and index.
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Author:
Reimer, Ludwig, 1928-
Series Added Entry
Springer series in optical sciences ; v. 45
Subject:
Scanning electron microscopy.